Defect localization capabilities of a global detection scheme
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Defect localization capabilities of a global detection scheme spatial pattern recognition using full-field vibration test data in plates by Atef F. Saleeb

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Published by National Aeronautics and Space Administration, Glenn Research Center, Available from NASA Center for Aerospace Information in [Cleveland, Ohio], Hanover, MD .
Written in English

Book details:

Edition Notes

Other titlesSpatial pattern recognition using full field vibration test data in plates.
StatementA.F. Saleeb and M. Prabhu.
Series[NASA contractor report] -- NASA/CR-2002-211685., NASA contractor report -- NASA CR-211685.
ContributionsNASA Glenn Research Center.
The Physical Object
Pagination1 v.
ID Numbers
Open LibraryOL17621358M

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